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Instrument Type :Dual beam d/8° spectrophotometer
Illumination Source :Pulsed xenon filtered to approximate D65
Sphere Diameter :152mm/6in
Wavelength Range :360 nm -700 nm
Reporting interval :10 nm
Photometric range :0-200%
Spectral Analyzer :SPX Analyzer
20 read repeatability on white tile using double flash (CIELAB) * :0.01 (max)
Inter-instrument agreement: reflectance measurements (CIELAB)*:0.08 (avg); 0.15 (max)
Sample Temperature :LAV aperture
IR Sensor Accuracy :±0.9°F/ ±0.5°C
Lens :4 position auto-zoom
Aperture Plates :3 standard: LAV (30mm illuminated, 26mm measured) SAV (9mm illuminated, 5 mm measured) USAV (6.6 mm illuminated, 2.5 mm measured); 2 optional: MAV (20 mm Illuminated, 16 mm measured) XUSAV (3.0 mm illuminated, 2.5 mm measured)
Aperture detection :Yes
Automated, adjustable UV calibration :Yes
UV cutoff filters :400 nm; 420 nm; 460 nm
Remote Measurement Button :Yes
Sample Positioning Camera :Yes
Transmittance:Yes
Inter-instrument agreement – regular transmittance at 550 nm:±0.20% at 85% T; ±0.10% at 32% T
Inter-Instrument agreement -transmission haze measurements: ±0.15% at 10% TH;
Transmission sampling aperture size: 22 mm
Operating Environment :Temperature: 5°C to 40°C, Max Relative Humidity 20%-85% non-condensing. Recommended; Relative Humidity 50% +/- 15% non-condensing
Vertical Mount :No
Physical Specifications Description:
Color Display :3.5 inch RGB LCD
Display Resolution :320x240 pixel resolution
Weight :44.0 lbs (20 kg)
Dimensions Size:Size: L 16.4” (41.66 cm) front to back, L 18.3” (46.48 cm) sample arm to back, H 15.3” x W 12.3” (38.86 cm x 31.24 cm)
