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SiC and GaN semiconductor components feature high power density and compact dimensions, causing heat to be concentrated within a very small chip area. The question of which thermal management solution is most widely used is often framed as a choice between four options: fans, heatsinks, thermal pads, or thermal grease. This framing requires some refinement, as these four components occupy different positions along the same heat-transfer path; in fact, most designs employ a combination of several of these elements. This article explains the role of each component, how to select thermal interface materials, and the impact of temperature on measurements.

Bidirectional DC power supplies combine source and sink operation in one platform. This supports realistic EV battery cycling, regenerative energy handling, programmable test sequences, and flexible battery or charger emulation.

For safer high-power DC testing, assess five protection functions: OVP, OCP, OTP, reverse-polarity protection, and short-circuit/fault protection. Together, they address abnormal voltage, current, heat, wiring, and system-fault conditions.

Bidirectional DC power supplies support realistic PV simulation, bidirectional energy flow, and automated scenarios for solar inverter, MPPT, and hybrid storage testing.

An EV power analyzer for inverter testing should match the required measurement accuracy, bandwidth, sampling rate, channel synchronization, voltage platform, software functions, and test-system interfaces.

A battery simulation DC power supply should be selected around the device under test: required voltage, peak current, power, charge/discharge behavior, dynamic response, model fidelity, integration, and protection needs.

A four-quadrant AC source or load can supply power to a device under test and absorb returned power. Selection should match the test setup’s power range, grid simulation, dynamic response, regeneration, automation, and safety requirements.

Electronic load testers apply programmable current, voltage, power, and resistance loads to recreate EV acceleration, cruising, regenerative braking, and stop-and-go operation in a repeatable laboratory setting.

MBE is an epitaxy technology that enables highly precise control over crystal growth, making it particularly suitable for researching semiconductor heterostructures, high-speed transistors, semiconductor lasers, and nanomaterials.

Input overload can lead to inaccurate RF measurements and potentially damage your probe. Learn about the causes, how to identify such issues, and how to select the right Keysight N9000B, N9010B, or FieldFox signal analyzer for your needs at EMIN