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E5071C ENA Vector Network Analyzer

ENA – New Standards in Speed, Accuracy and Versatility

Keysight’s E5071C ENA vector network analyzers deliver new standards in speed, accuracy and versatility for RF network analysis. Designed with a wide range of measurement capability to meet multiple network analysis needs, the ENA offers efficiency and flexibility for both manufacturing and R&D applications in industries such as wireless communication, automotive, semiconductor, and medical.


Keysight’s E5071C ENA vector network analyzers deliver new standards in speed, accuracy and versatility for RF network analysis. Designed with a wide range of measurement capability to meet multiple network analysis needs, the ENA offers efficiency and flexibility for both manufacturing and R&D applications in industries such as wireless communication, automotive, semiconductor, and medical.


Key Features

• Wide frequency coverage: 9 kHz to 20 GHz

• Low trace noise: < 0.004 dB rms at 70 kHz IFBW

• Wide dynamic range: > 123 dB

• Fast measurement speed: 9 msec for 401 points with error correction

• High-temperature stability: 0.005 dB/°C

• 2 or 4 ports, plus flexible multiport configuration of up to 22 ports with E5092A

• Built-in VBA programming environment enables high throughput and UI customization

• Powerful analysis and error correction

• Advanced characterization of mixers (such as the vector mixer calibration) and amplifiers with frequency offset mode (optional)

• Advanced characterization of high-speed serial interconnects with enhanced time domain analysis (optional)

• Upgrades are available for all E5071C options at any time


Flexible Test Port Architecture for a Variety of Applications

Select the number of ports, frequency and bias tees to fit your application.


Enhanced Usability Increases Efficiency in R&D & Manufacturing

Providing the latest in modern technology, Keysight E5071C ENA vector network analyzer provides the performance and features needed in R&D and manufacturing for a wide range of applications.


ENA – New Standards in Speed and Accuracy

Keysight’s new generation of network analyzers meets and exceeds what was possible with the 8753 family. Carrying on the family tradition, the ENA delivers new standards in speed, accuracy and versatility for RF network analysis.

Wide dynamic range

> 123 dB dynamic range provides more precise evaluation of high rejection filters.


Low trace noise

< 0.004 dBrms at 70 kHz IFBW helps minimize errors when measuring high-quality, low-loss devices.


High stability

4 times better long-term temperature stability than the 8753ES for more confident evaluations.


Fast measurement speed

More than 20 times faster than the 8753ES to increase your throughput and lower your cost per component.


Enhanced Measurement Capability for a Variety of Applications

The Keysight E5071C ENA combines the highest RF performance with powerful analysis capabilities and automated test tools that increase test efficiency and yield.

Powerful analysis capabilities

• Fixture simulator for:

- Mixed-mode S-parameter measurements.

- Embedding and de-embedding.

- Matching circuit simulation.

- Port impedance conversion.

• Equation editor for real-time data processing.

• Time-domain analysis (optional).

• Enhanced time-domain analysis (optional).

• Absolute value measurement.

• 75 Ω measurement with a minimum loss pad.

• Modeling devices with Keysight Advanced Design System (ADS) and IC-CAP.

• Dielectric and magnetic properties measurement with Keysight materials measurement software.

State-of-art calibration techniques

• Up to full 4-port SOLT, TRL, or unknown thru calibration

• Automatic port extension

• Adapter removal or insertion

• ECal module with various connector types or user-characterized ECal for use with any adapter

• Scalar mixer calibration and patented vector mixer calibration (2)

Test automation tools

• Easy-to-use built-in VBA programming environment for fast post data processing.

• Measurement Wizard Assistant (MWA) software for multiport measurement system (optional).

• Pre-defined limit test functions for pass/fail testing in production.

1. 4-port option required.

2. E5071C-008 frequency offset mode required. 

N4431D RF Electronic Calibration Module (ECal), DC to 13.5 GHz, 4-ports |  KeysightHigh-performance ECal modules dramatically simplify the calibration process

Fixture simulator settings with the setup wizard


Built-in VBA programming and customizable user interface

Impedance value display


Accurate and Efficient Component Design and Verification 

Circuits

With a combination of speed, accuracy, and advanced functionality, the ENA provides powerful general-purpose network analysis. The ENA offers extensive measurement capabilities, analysis features, and post-data processing capabilities for effective design characterization.

The ENA has real-time fixture simulation capability, which lets you specify components as they are used in actual circuits. Bundled VBA macros and analysis functions enable fast, easy post-data processing. Measured data is easily shared with EDA tools, such as Keysight’s Advanced Design System (ADS). This enables you to quickly link measurement results back to your simulations to improve your designs and accelerate design verification.

Industry-leading RF performance

Design high-performance products with confidence.

• State-of-the-art calibration techniques for the highest measurement accuracy

• Automatic port extension for in-fixture devices

• Fixture simulator for embedding or de-embedding user-defined circuits

Accelerate design verification

Simplify complicated measurement procedures and reduce your test program development time.

• Free sample programs on the Keysight Web site

• Equation editor for real-time data processing

• Powerful connectivity with Windows OS; USB, LAN, GPIB, and a Web-based remote user interface

Completely upgradeable at any time

Keep up with rapidly changing device requirements and parameters.

• Upgrade to current E5071C hardware or software options at any time

State-of-art calibration techniques

Design high-performance products with confidence.

• State-of-the-art calibration techniques for the highest measurement accuracy

• Automatic port extension for in-fixture devices

• Fixture simulator for embedding or de-embedding user-defined circuits

Industry-Leading RF Performance for the Highest Throughput and Yield 

Passive components

The ENA is ideal for high-volume passive component tests. Superior measurement performance contributes to the highest throughput increasing your production capability. High repeatability and stability improve test yield.



Best-in-class RF performance

Increase test throughput and reduce the overall cost of test.

• Increase test throughput and reduce the overall cost of test.

• Fast measurement speed

• Built-in VBA for easy automation and fast data processing

• Pre-defined limit test functions to meet your test requirements

• Segment sweep function to optimize stimulus setting

• ECal for reduced calibration times



High repeatability increases test yields

Improve test yields with superior measurement performance.

• Low trace noise

• Wide dynamic range

• High-temperature stability



Easy, accurate in-fixture calibration

Reduce measurement errors.

• 4-port TRL calibration for multiport calibration

• Automatic port extension (APE) for easy calibration

• Adapter removal/insertion for accurate mixed-connector calibration

Basic and Advanced Measurement Utilities Enable Through Device Characterization

Amplifiers

RF amplifiers are used in a wide variety of industries. Whether characterizing the amplifier performance for wireless communication systems, medical equipment or automotive use, their characterization is always a significant stage in the design and verification process of complete systems. The ENA features the basic measurement fundamentals for P1dB, PAE or K-factor as well as advanced techniques and built-in functions that simplify the total characterization of your amplifiers.


Advanced measurement utilities

Simplify the total characterization of your amplifiers with built-in functions.

• DC voltage measurement capability

• Built-in bias tee option

• External test set mode for high-power measurements

• Trigger lines for complicated testing


Powerful data processing

Quickly and easily process post-measurement data.

• Amplifier measurement wizard program

• Equation editor for user-defined parameters


Easy software connectivity

Quickly link measurement results back to your simulations.

• Intuilink software

• ADS link with Advanced Design System software

State-of-the-Art Measurement Capability 

Mixers and converters

Frequency converting devices such as mixers are used in many applications. These components require unique measurement techniques because they have different frequencies at the input and output ports.

The ENA offers several measurement methods for accurate characterization of these devices. Advanced calibration methods including Keysight patented vector mixer calibration (VMC) provide more accurate measurement results of your devices than conventional calibration methods.


Powerful built-in software functions

Reduce setup and measurement times.

• Frequency offset mode (FOM) option.

• Balanced mixer measurement.

• Absolute group delay measurement.


Easy-to-use analysis software

Reduce your operating time.

• Mixer measurement wizard program

• Vector mixer characterization program

State-of-the-art calibration

Accurately characterize frequency converting devices.

• Power and receiver calibration

• Scalar mixer calibration (SMC) for match corrected amplitude measurement

• Vector mixer calibration (VMC) for single-ended and balanced mixer measurement


Expand Your Measurement Capability with the ENA Multiport Solution

Multiport devices

Today’s devices often have multiple functionalities integrated into a single component resulting in multiple RF ports. For multiport network analysis, measurement setup time is usually much longer than the actual testing time.

When the ENA is combined with the E5092A configurable multiport test set, they form a comprehensive multiport solution. The ENA’s Measurement Wizard Assistant (MWA) software simplifies complicated measurement procedures for multiport characterization.


Flexible multiport configuration

Meet the increasing, changing demands of multiport devices.

• E5092A configurable multiport test set

• Up to 10-port full crossbar measurement

• Up to 22-port measurement capability


Significantly reduce test setup times

Simplify complicated multiport measurements with Measurement Wizard Assistant software.

• Step-by-setup wizard for file setup

• Automatic parameter setup for the ENA

• Calibration wizard

• Detailed analysis of the measurement results


Easily expand up to 40 ports

Meet future demands with expandable multiport capability.

• Up to 16-port full crossbar measurement

• Up to 40-port measurement capability 


Evaluate Performance Under Actual Working Conditions

EMC components

Electromagnetic compatibility (EMC) is a key specification in broadband wireless communication and automotive electronics, where EMC components play an important role in meeting strict standard requirements. The ENA’s powerful analysis functions help you determine the true performance of your product under the actual working conditions.

Broad operating frequency coverage

Evaluate a wide range of applications.

• Down to 9 kHz/100 kHz (with bias tees)

• Upgradeable to a higher frequency

Easy-to-use assistant programs

1. Evaluate EMC components under actual bias conditions VBA sample program.

• Impedance format display with bias current control function

• External DC source control via GPIB1/USB or LAN interface

2. Display MaxHOLD trace VBA sample program

• Both GUI and remote control functions are available2

• Useful for the EMC site evaluation and the site VSWR measurement. (eg.CISPR16-1-4)


Powerful balance measurement analysis

Reduce the complexity of measurements for balanced components.

• 4-port embedding/de-embedding to remove unwanted fixture effects or to simulate circuit effects

• Impedance value display

• Common mode rejection ratio (CMRR) measurement



Obtain Confidence in Design Through Complete Characterization of High-Speed Serial Interconnects

High-speed serial interconnects

As bit rates of digital systems increase, signal integrity of interconnects drastically affects system performance. Fast and accurate analysis of interconnect performance in both time and frequency domains become critical to ensure reliable system performance.

Because managing multiple test systems becomes difficult, a single test system that can fully characterize differential high-speed digital devices is a very powerful tool.

The enhanced time domain analysis option provides a one-box solution for high-speed interconnect analysis, enabling time domain, frequency domain, and eye diagram analysis.

The enhanced time domain analysis option provides the following three breakthroughs for signal integrity design and verification:

• Simple and intuitive operation

• Fast and accurate measurements

• ESD robustness

Simple and intuitive operation

TDR oscilloscope look-and-feel.

• Dedicated controls for common adjustments

• Automatic display allocation for most common measurement parameters

• The Setup Wizard guides the user through all the required steps, making setup, error correction, and measurement intuitive and error free


ESD robustness

Protection circuits implemented inside the instrument.

• Proprietary electrostatic discharge (ESD) protection chip to significantly increase ESD robustness, while at the same time maintaining excellent RF performance.

Fast and accurate measurements

Delivers new standards in speed, accuracy, and versatility.

• Wide dynamic range to observe the true performance of your device

• Low noise floor for accurate and repeatable measurements

• Fast measurement speed for real-time analysis

• State-of-the-art calibration techniques to reduce measurement errors


Accurate, Easy-to-Use Solution for On Wafer Test

On-wafer measurements

For successful evaluation of on-wafer semiconductor or RF MEMS devices, the total accuracy of your measurement system and easy operation are crucial. The ENA offers state-of-the-art features for accurate measurements and compatibility with many probe systems.

A complete solution for your on-wafer measurements.

• Accurate calibration at probe tips

• Supported by IC-CAP and ADS connection manager

• Supported by popular on-wafer calibration software

• Two GSGSG probe contacts using a 4-port test set


Simple material evaluation

Material measurements

Simplify your material test in the RF range by combining the ENA with ready-to-use Keysight materials measurement software and probe kits. The ENA’s highly-accurate measurements will help you determine the highest performing materials for your application, shortening your design time.


Dielectric constant

Measure the dielectric characteristics over a wide frequency range.

• Supported by N1500A Materials Measurement Suite and the N1501A dielectric probe kit


Key Specifications



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