Ophir Ge/3.5/1.8μm Scanning Slit Beam Profiler With NanoScan (700-1800nm)
생산업체: Ophir Model: Ge/3.5/1.8μm P/N: PH00459 - 연락처
Call for the best price
Hanoi city: (024) 35.381.269
Danang city: (023) 63.747.711
Bac Ninh city: (0222)730.39.68
HCM city: (028) 38.119.636
Wavelengths: 700-1800nm
Slit size: 1.8μm
Beam Sizes: 7μm-~2.3mm
Spatial sampling resolution: 5.3nm-18.3μm
Scan frequency: 1.25, 2.5, 5, 10, 20Hz
Bus Interface: USB 2.0
Sensor Type: Germanium
Compatible Light Sources: CW, Pulsed >25kHz
Power Range: ~10nW - ~10W
Aperture Size: 3.5mm
Scanhead Size: 83mm
Weight: 434g (15.3 ounces)
Operating temperature: 0-50ºC
Humidity: 90%, non-condensing
Scanhead dimensions: 76.8mm L x 63.5mm Ø
CPU clock: 300MHz
Memory clock: 264MHz
Compliance: CE, UKCA, China RoHS
NanoScan Standard: NS2s-Ge/3.5/1.8-STD
Details
- 품질 보증
- 공인 보증
- 집으로 배달
- 간단하게 거래하기