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Chotest SuperView W1 纳米3D光学表面轮廓仪 (≤10mm; 0.1nm)
制造商: Chotest Model: SuperView W1 - 报价要求
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Standard field of view: (0.98*0.98)mm
Max field of view: (6x6)mm
Reflectivity of test object: 0.5 % ~100 %
Repeatability of Roughness RMS: 0.005nm
Scanning range: ≤10mm
Resolution: 0.1nm
Accuracy of stage measurement: 0.3 %
Repeatability of stage measurement: 0.08% 1σ
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