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Chotest SuperView W3 纳米3D光学表面轮廓仪 (≤10mm; 0.1nm)

Standard field of view: (0.49*0.49)mm

Max field of view: (6x6)mm

Reflectivity of test object: 0.5 % ~100 %

Repeatability of Roughness RMS: 0.005nm

Scanning range: ≤10mm

Resolution: 0.1nm

Accuracy of stage measurement: 0.3 %

Repeatability of stage measurement: 0.08% 1σ

X, Y Object table:

    Size: (450x450)mm

    Moving range: (300x300)mm

    Load capacity: 10kg

    Control method: Motorized



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