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Universal instrument for measurements on small structures, multilayers, functional layers and thin coatings < 0.1 µm
Measuring direction with measuring top down
Microfocus tube with tungsten anode
4-fold changeable apertures
3-fold changeable filter
Silicon drift detector 20 or 50 mm² for highest precision on thin layers
Various measuring table options: manual pull-out,optional with measuring table extension or automated, for PCBs up to 610 × 610 mm
Certified fully protective device
Applications
Material analysis of coatings and alloys (also thin coatings and low concentrations)
Electronics industry, ENIG/ENEPIG
Connectors and contacts
Gold, jewelry and watchmaking industry
Measurement of thin (a few nanometers) gold and palladium coatings in PCB manufacturing
Analysis of trace elements
Determination of lead (Pb) for high-reliability applications (tin-whisker avoidance)
Analysis of hard material coatings
Brochure
